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/*$Id: d_mos.h,v 11.30 96/03/17 19:21:51 al Exp $ -*- C++ -*-
* data structures and defaults for mos model.
* internal units all mks (meters)
* but some user input parameters are in cm.
*/
#include "d_diode.h"
#include "e_subckt.h"
#ifndef D_MOS_H
#define D_MOS_H
/*--------------------------------------------------------------------------*/
class DEV_MOS; /* this file */
class MOS_COMMON;
class MODEL_MOS;
class EVAL_MOS_Ids;
class EVAL_MOS_Gmf;
class EVAL_MOS_Gmr;
class EVAL_MOS_Gds;
class EVAL_MOS_Gmbf;
class EVAL_MOS_Gmbr;
class EVAL_MOS_Cgb;
class EVAL_MOS_Cgd;
class EVAL_MOS_Cgs;
/*--------------------------------------------------------------------------*/
class DEV_ADMITTANCE; /* external */
class DEV_DIODE;
class DEV_CAPACITANCE;
class DEV_CS;
class DEV_RESISTANCE;
class DEV_VCCS;
enum {mNUM_INIT_COND = 3};
/*--------------------------------------------------------------------------*/
class DEV_MOS : public BASE_SUBCKT {
friend class MODEL_MOS;
friend class EVAL_MOS_Ids;
friend class EVAL_MOS_Gmf;
friend class EVAL_MOS_Gmr;
friend class EVAL_MOS_Gds;
friend class EVAL_MOS_Gmbf;
friend class EVAL_MOS_Gmbr;
friend class EVAL_MOS_Cgb;
friend class EVAL_MOS_Cgd;
friend class EVAL_MOS_Cgs;
public:
DEV_MOS();
DEV_MOS(CONST DEV_MOS& p);
~DEV_MOS(){--Count;}
CARD* clone()CONST{return new DEV_MOS(*this);}
void parse(CS&);
void print(int,int)const;
void expand();
double probe_tr_num(const char*)const;
bool dotr();
static int count(){return Count;}
private:
void limit_mos(double,double,double);
private:
double ids; /* iterated parameters, latest */
double gm;
double gds;
double gmb;
double vgs; /* terminal voltages */
double vds;
double vbs;
double vdsat; /* saturation voltage */
double vgst; /* vgs - von. */
double von; /* actual threshold voltage */
bool reversed; /* flag: Vgs < 0, reverse s & d */
bool cutoff; /* flag: in cut off region */
bool subthreshold; /* flag: subthreshold region (L2 only) */
bool saturated; /* flag: in saturation region */
bool sbfwd; /* flag: sb diode fwd biased */
bool dbfwd; /* flag: db diode fwd biased */
bool punchthru; /* flag: punch thru region */
node_t drainnode; /* internal drain node */
node_t sourcenode; /* internal source node */
DEV_RESISTANCE* Rs; /* subckt elements, for probe */
DEV_RESISTANCE* Rd;
DEV_DIODE* Ddb;
DEV_DIODE* Dsb;
DEV_CAPACITANCE* Cgs;
DEV_CAPACITANCE* Cgd;
DEV_CAPACITANCE* Cgb;
DEV_VCCS* Gmbf;
DEV_VCCS* Gmbr;
DEV_ADMITTANCE* Yds;
DEV_VCCS* Gmf;
DEV_VCCS* Gmr;
DEV_CS* Ids;
enum {NUMNODES = 4};
static int Count;
};
/*--------------------------------------------------------------------------*/
class MOS_COMMON : public COMPONENT_COMMON {
public:
MOS_COMMON();
MOS_COMMON(const MOS_COMMON& p){*this = p; attachcount=0;}
double lo; /* drawn (optical) channel length */
double wo; /* channel width (drawn) */
double ad_in; /* drain area, drawn */
double as_in; /* source area, drawn */
double pd; /* drain perimeter */
double ps; /* source perimeter */
double nrd; /* drain # squares */
double nrs; /* source # squares */
double ic[mNUM_INIT_COND]; /* initial conditions */
int off; /* off flag */
int icset; /* flag: initial conditions set */
/* up to here initialized */
double le; /* actual (electrical) channel length */
double we; /* actual (electrical) channel width */
double ad; /* drain area, actual */
double as; /* source area, actual */
double cgate; /* gate to channel capacitance */
double beta; /*?*/ /* transconductance term (kp*w/l) */
double relxj; /*?*/
double eta_1; /*?*/
double eta; /*?*/
double eta_2; /*?*/
double idsat; /*?*/ /* drain junction saturation current */
double issat; /*?*/ /* source junction saturation current */
double rd; /*?*/ /* ohmic drain resistance */
double rs; /*?*/ /* ohmic source resistance */
double sigma; /*?*/ /* lev 3 */
/*?*//* indicates calculated from other params */
DIODE_COMMON sb;
DIODE_COMMON db;
};
/*--------------------------------------------------------------------------*/
class MODEL_MOS : public MODEL_DIODE {
friend class DEV_MOS;
friend class EVAL_MOS_Ids;
friend class EVAL_MOS_Gmf;
friend class EVAL_MOS_Gmr;
friend class EVAL_MOS_Gds;
friend class EVAL_MOS_Gmbf;
friend class EVAL_MOS_Gmbr;
friend class EVAL_MOS_Cgb;
friend class EVAL_MOS_Cgd;
friend class EVAL_MOS_Cgs;
public:
MODEL_MOS(const char *name = "");
MODEL_MOS(const MODEL_MOS&){assert(0);}
CARD* clone()CONST{return new MODEL_MOS(*this);}
void parse(CS&);
void print(int,int)const;
void tr_eval(COMPONENT*)const;
private:
void eval_mos1(DEV_MOS*)const;
void eval_mos2(DEV_MOS*)const;
void eval_mos3(DEV_MOS*)const;
private: /* input parameters */
double vto; /* zero-bias threshold voltage */
double kp; /* transconductance parameter */
double gamma; /* bulk threshold parameter */
double phi; /* surface potential */
double lambda; /* channel-length modulation */
double rd; /* drain ohmic resistance */
double rs; /* source ohmic resistance */
double cbd; /* 0-bias BD jct capacitance */
double cbs; /* 0-bias BS jct capacitance */
double is; /* bulk jct sat current */
double cgso; /* GS overlap capacitance */
double cgdo; /* GD overlap capacitance */
double cgbo; /* GB overlap capacitance */
double rsh; /* D & S diffusion sheet resistance */
double js; /* bulk jct sat current per sq meter */
double tox; /* oxide thickness */
double nsub; /* substrate doping */
double nss; /* surface state density */
double nfs; /* fast surface state density */
double xj; /* metallurgical junction depth */
double ld; /* lateral diffusion */
double uo; /* surface mobility */
double ucrit; /* critical field mobility degradation */
double uexp; /* critical field exponent in mob.deg. (mos2) */
double utra; /* transverse field coefficient (not used) */
double vmax; /* max drift velocity of carriers */
double neff; /* total channel charge coefficient */
double kf; /* flicker noise coefficient */
double af; /* flicker noise exponent */
double delta; /* width effect on threshold voltage */
double theta; /* mobility modulation (mos3, s.s. vbp) */
double eta; /* static feedback (mos3, spice shares uexp) */
double kappa; /* saturation field vector (mos3, s.s. utra) */
int level; /* which model to use */
enum gate_t {gOPP = -1, gMETAL = 0, gSAME = 1};
gate_t tpg; /* type of gate material */
enum polarity_t {pP = -1, pN = 1};
polarity_t polarity; /* N or P channel */
/* calculated parameters */
double alpha; /* ((2. * E_SI / Q) / nsub) */
double xd; /* sqrt(alpha) */
double cox; /* oxide capacitance (E_OX / tox) */
double vfb; /* flat-band voltage */
double vbi; /* "built-in" voltage (vfb + phi) */
double xwb; /* xd * sqrt(pb) */
double vbp; /* ucrit * E_SI / cox (mos2) */
double cfsox; /* Q * nfs / cox */
double delta3; /* level 3 version of delta */
double sqrt_phi; /* sqrt(phi) */
double phi_sqrt_phi; /* phi * sqrt(phi) or pow(phi,1.5) */
struct {
unsigned vto:1, /* flags: set if the parameter has been */
kp:1, /* calculated as opposed to entered, so */
gamma:1, /* it will be re-calculated as needed. */
phi:1,
cj:1;
} calc;
};
/*--------------------------------------------------------------------------*/
class EVAL_MOS_Ids : public COMPONENT_COMMON {
public:
void tr_eval(COMPONENT*d)const;
bool has_tr_eval()const {return true;}
bool has_ac_eval()const {return false;}
};
/*--------------------------------------------------------------------------*/
class EVAL_MOS_Gmf : public COMPONENT_COMMON {
public:
void tr_eval(COMPONENT*d)const;
bool has_tr_eval()const {return true;}
bool has_ac_eval()const {return false;}
};
/*--------------------------------------------------------------------------*/
class EVAL_MOS_Gmr : public COMPONENT_COMMON {
public:
void tr_eval(COMPONENT*d)const;
bool has_tr_eval()const {return true;}
bool has_ac_eval()const {return false;}
};
/*--------------------------------------------------------------------------*/
class EVAL_MOS_Gds : public COMPONENT_COMMON {
public:
void tr_eval(COMPONENT*d)const;
bool has_tr_eval()const {return true;}
bool has_ac_eval()const {return false;}
};
/*--------------------------------------------------------------------------*/
class EVAL_MOS_Gmbf : public COMPONENT_COMMON {
public:
void tr_eval(COMPONENT*d)const;
bool has_tr_eval()const {return true;}
bool has_ac_eval()const {return false;}
};
/*--------------------------------------------------------------------------*/
class EVAL_MOS_Gmbr : public COMPONENT_COMMON {
public:
void tr_eval(COMPONENT*d)const;
bool has_tr_eval()const {return true;}
bool has_ac_eval()const {return false;}
};
/*--------------------------------------------------------------------------*/
class EVAL_MOS_Cgb : public COMPONENT_COMMON {
public:
void tr_eval(COMPONENT*d)const;
bool has_tr_eval()const {return true;}
bool has_ac_eval()const {return false;}
};
/*--------------------------------------------------------------------------*/
class EVAL_MOS_Cgd : public COMPONENT_COMMON {
public:
void tr_eval(COMPONENT*d)const;
bool has_tr_eval()const {return true;}
bool has_ac_eval()const {return false;}
};
/*--------------------------------------------------------------------------*/
class EVAL_MOS_Cgs : public COMPONENT_COMMON {
public:
void tr_eval(COMPONENT*d)const;
bool has_tr_eval()const {return true;}
bool has_ac_eval()const {return false;}
};
/*--------------------------------------------------------------------------*/
/* dimension conversions.
* All internal distances are in meters.
* In some cases the user data is in other units
*/
#define CM2M (1e-2) /* centimeters to meters */
#define CM2M2 (1e-4) /* ........... squared */
#define ICM2M (1e2) /* inverse ........... */
#define ICM2M2 (1e4) /* inverse ........... squared */
#define ICM2M3 (1e6) /* inverse ........... cubed */
#define MICRON2METER (1e-6) /* microns to meters */
/*--------------------------------------------------------------------------*/
#define NI (1.45e16) /* intrinsic carrier concentration */
#define nDRAIN n[0] /* nodes */
#define nGATE n[1]
#define nSOURCE n[2]
#define nBULK n[3]
#define mDEFAULT_is 1e-14 /* last resort defaults */
/* in case can't calculate */
/*--------------------------------------------------------------------------*/
/*--------------------------------------------------------------------------*/
#endif
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