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/*
Copyright (C) 2006 Yangli Hector Yee
Copyright (C) 2006 Red Hat, Inc.
This program is free software; you can redistribute it and/or modify it under the terms of the
GNU General Public License as published by the Free Software Foundation; either version 2 of the License,
or (at your option) any later version.
This program is distributed in the hope that it will be useful, but WITHOUT ANY WARRANTY;
without even the implied warranty of MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE.
See the GNU General Public License for more details.
You should have received a copy of the GNU General Public License along with this program;
if not, write to the Free Software Foundation, Inc., 51 Franklin Street, Suite 500, Boston, MA 02110-1335, USA
*/
#ifndef _PDIFF_H
#define _PDIFF_H
#include <cairo.h>
typedef int bool;
#ifndef true
#define true 1
#endif
#ifndef false
#define false 0
#endif
/* Image comparison metric using Yee's method (and a cairo interface)
* References: A Perceptual Metric for Production Testing, Hector Yee, Journal of Graphics Tools 2004
*/
int
pdiff_compare (cairo_surface_t *surface_a,
cairo_surface_t *surface_b,
double gamma,
double luminance,
double field_of_view);
#endif
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