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/* SPDX-License-Identifier: BSD-3-Clause
* Copyright(c) 2010-2014 Intel Corporation
*/
#ifndef _TEST_H_
#define _TEST_H_
#include <errno.h>
#include <stddef.h>
#include <stdlib.h>
#include <sys/queue.h>
#include <rte_hexdump.h>
#include <rte_common.h>
#include <rte_os_shim.h>
#define TEST_SUCCESS EXIT_SUCCESS
#define TEST_FAILED -1
#define TEST_SKIPPED 77
/* Before including test.h file you can define
* TEST_TRACE_FAILURE(_file, _line, _func) macro to better trace/debug test
* failures. Mostly useful in test development phase. */
#ifndef TEST_TRACE_FAILURE
# define TEST_TRACE_FAILURE(_file, _line, _func)
#endif
#include <rte_test.h>
#define TEST_ASSERT RTE_TEST_ASSERT
#define TEST_ASSERT_EQUAL RTE_TEST_ASSERT_EQUAL
/* Compare two buffers (length in bytes) */
#define TEST_ASSERT_BUFFERS_ARE_EQUAL(a, b, len, msg, ...) do { \
if (memcmp(a, b, len)) { \
printf("TestCase %s() line %d failed: " \
msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
TEST_TRACE_FAILURE(__FILE__, __LINE__, __func__); \
return TEST_FAILED; \
} \
} while (0)
/* Compare two buffers with offset (length and offset in bytes) */
#define TEST_ASSERT_BUFFERS_ARE_EQUAL_OFFSET(a, b, len, off, msg, ...) do { \
const uint8_t *_a_with_off = (const uint8_t *)a + off; \
const uint8_t *_b_with_off = (const uint8_t *)b + off; \
TEST_ASSERT_BUFFERS_ARE_EQUAL(_a_with_off, _b_with_off, len, msg); \
} while (0)
/* Compare two buffers (length in bits) */
#define TEST_ASSERT_BUFFERS_ARE_EQUAL_BIT(a, b, len, msg, ...) do { \
uint8_t _last_byte_a, _last_byte_b; \
uint8_t _last_byte_mask, _last_byte_bits; \
TEST_ASSERT_BUFFERS_ARE_EQUAL(a, b, (len >> 3), msg); \
if (len % 8) { \
_last_byte_bits = len % 8; \
_last_byte_mask = ~((1 << (8 - _last_byte_bits)) - 1); \
_last_byte_a = ((const uint8_t *)a)[len >> 3]; \
_last_byte_b = ((const uint8_t *)b)[len >> 3]; \
_last_byte_a &= _last_byte_mask; \
_last_byte_b &= _last_byte_mask; \
if (_last_byte_a != _last_byte_b) { \
printf("TestCase %s() line %d failed: " \
msg "\n", __func__, __LINE__, ##__VA_ARGS__);\
TEST_TRACE_FAILURE(__FILE__, __LINE__, __func__); \
return TEST_FAILED; \
} \
} \
} while (0)
/* Compare two buffers with offset (length and offset in bits) */
#define TEST_ASSERT_BUFFERS_ARE_EQUAL_BIT_OFFSET(a, b, len, off, msg, ...) do { \
uint8_t _first_byte_a, _first_byte_b; \
uint8_t _first_byte_mask, _first_byte_bits; \
uint32_t _len_without_first_byte = (off % 8) ? \
len - (8 - (off % 8)) : \
len; \
uint32_t _off_in_bytes = (off % 8) ? (off >> 3) + 1 : (off >> 3); \
const uint8_t *_a_with_off = (const uint8_t *)a + _off_in_bytes; \
const uint8_t *_b_with_off = (const uint8_t *)b + _off_in_bytes; \
TEST_ASSERT_BUFFERS_ARE_EQUAL_BIT(_a_with_off, _b_with_off, \
_len_without_first_byte, msg); \
if (off % 8) { \
_first_byte_bits = 8 - (off % 8); \
_first_byte_mask = (1 << _first_byte_bits) - 1; \
_first_byte_a = *(_a_with_off - 1); \
_first_byte_b = *(_b_with_off - 1); \
_first_byte_a &= _first_byte_mask; \
_first_byte_b &= _first_byte_mask; \
if (_first_byte_a != _first_byte_b) { \
printf("TestCase %s() line %d failed: " \
msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
TEST_TRACE_FAILURE(__FILE__, __LINE__, __func__); \
return TEST_FAILED; \
} \
} \
} while (0)
#define TEST_ASSERT_NOT_EQUAL RTE_TEST_ASSERT_NOT_EQUAL
#define TEST_ASSERT_SUCCESS RTE_TEST_ASSERT_SUCCESS
#define TEST_ASSERT_FAIL RTE_TEST_ASSERT_FAIL
#define TEST_ASSERT_NULL RTE_TEST_ASSERT_NULL
#define TEST_ASSERT_NOT_NULL RTE_TEST_ASSERT_NOT_NULL
struct unit_test_case {
int (*setup)(void);
void (*teardown)(void);
int (*testcase)(void);
int (*testcase_with_data)(const void *data);
const char *name;
unsigned enabled;
const void *data;
};
#define TEST_CASE(fn) { NULL, NULL, fn, NULL, #fn, 1, NULL }
#define TEST_CASE_NAMED(name, fn) { NULL, NULL, fn, NULL, name, 1, NULL }
#define TEST_CASE_ST(setup, teardown, testcase) \
{ setup, teardown, testcase, NULL, #testcase, 1, NULL }
#define TEST_CASE_WITH_DATA(setup, teardown, testcase, data) \
{ setup, teardown, NULL, testcase, #testcase, 1, data }
#define TEST_CASE_NAMED_ST(name, setup, teardown, testcase) \
{ setup, teardown, testcase, NULL, name, 1, NULL }
#define TEST_CASE_NAMED_WITH_DATA(name, setup, teardown, testcase, data) \
{ setup, teardown, NULL, testcase, name, 1, data }
#define TEST_CASE_DISABLED(fn) { NULL, NULL, fn, NULL, #fn, 0, NULL }
#define TEST_CASE_ST_DISABLED(setup, teardown, testcase) \
{ setup, teardown, testcase, NULL, #testcase, 0, NULL }
#define TEST_CASES_END() { NULL, NULL, NULL, NULL, NULL, 0, NULL }
static inline void
debug_hexdump(FILE *file, const char *title, const void *buf, size_t len)
{
if (rte_log_get_global_level() == RTE_LOG_DEBUG)
rte_hexdump(file, title, buf, len);
}
struct unit_test_suite {
const char *suite_name;
int (*setup)(void);
void (*teardown)(void);
unsigned int total;
unsigned int executed;
unsigned int succeeded;
unsigned int skipped;
unsigned int failed;
unsigned int unsupported;
struct unit_test_suite **unit_test_suites;
struct unit_test_case unit_test_cases[];
};
int unit_test_suite_runner(struct unit_test_suite *suite);
extern int last_test_result;
#define RECURSIVE_ENV_VAR "RTE_TEST_RECURSIVE"
#include <cmdline_parse.h>
#include <cmdline_parse_string.h>
extern const char *prgname;
int commands_init(void);
int command_valid(const char *cmd);
int test_exit(void);
int test_mp_secondary(void);
int test_panic(void);
int test_timer_secondary(void);
int test_set_rxtx_conf(cmdline_fixed_string_t mode);
int test_set_rxtx_anchor(cmdline_fixed_string_t type);
int test_set_rxtx_sc(cmdline_fixed_string_t type);
typedef int (test_callback)(void);
TAILQ_HEAD(test_commands_list, test_command);
struct test_command {
TAILQ_ENTRY(test_command) next;
const char *command;
test_callback *callback;
};
void add_test_command(struct test_command *t);
/* Register a test function with its command string. Should not be used directly */
#define REGISTER_TEST_COMMAND(cmd, func) \
static struct test_command test_struct_##cmd = { \
.command = RTE_STR(cmd), \
.callback = func, \
}; \
RTE_INIT(test_register_##cmd) \
{ \
add_test_command(&test_struct_##cmd); \
}
/* Register a test function as a particular type.
* These can be used to build up test suites automatically
*/
#define REGISTER_FAST_TEST(cmd, no_huge, ASan, func) REGISTER_TEST_COMMAND(cmd, func)
#define REGISTER_PERF_TEST REGISTER_TEST_COMMAND
#define REGISTER_DRIVER_TEST REGISTER_TEST_COMMAND
#define REGISTER_STRESS_TEST REGISTER_TEST_COMMAND
#endif
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