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@article{trasobares_chemical_2011,
title = {Chemical Imaging at Atomic Resolution as a Technique To Refine the Local Structure of Nanocrystals},
issn = {14337851},
url = {http://onlinelibrary.wiley.com/doi/10.1002/anie.201004502/abstract},
doi = {10.1002/anie.201004502},
journal = {Angewandte Chemie International Edition},
author = {Trasobares, Susana and {López-Haro}, Miguel and Kociak, Mathieu and March, Katia and de La Peña, Francisco and {Perez-Omil}, Jose A. and Calvino, Jose J. and Lugg, Nathan R. and {D'Alfonso}, Adrian J. and Allen, Leslie J. and Colliex, Christian},
month = jan,
year = {2011},
pages = {n/a--n/a}
},
@article{estrade_cationic_2008,
title = {Cationic and charge segregation in La[sub {2/3]Ca[sub} {1/3]MnO[sub} 3] thin films grown on (001) and (110) {SrTiO[sub} 3]},
volume = {93},
url = {http://link.aip.org/link/?APL/93/112505/1},
doi = {10.1063/1.2981574},
number = {11},
journal = {Applied Physics Letters},
author = {Estrade, S. and Arbiol, J. and Peiro, F. and Infante, I. C. and Sanchez, F. and Fontcuberta, J. and de la Peña, F. and Walls, M. and Colliex, C.},
year = {2008},
keywords = {My Publications},
pages = {112505--3}
},
@article{de_la_pena_full_2010,
title = {Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns},
volume = {604},
issn = {0039-6028},
url = {http://www.sciencedirect.com/science/article/B6TVX-509XPNT-3/2/aa36bb3b2b7d94cee13ee35b9d1c39d1},
doi = {10.1016/j.susc.2010.06.006},
abstract = {Fully energy-filtered X-ray photoelectron emission microscopy is used to analyze the spatial distribution of the silicon sub-oxide structure at the {SiO2/Si} interface as a function of underlying doping pattern. Using a spectroscopic pixel-by-pixel curve fitting analysis, we obtain the sub-oxide binding energy and intensity distributions over the full field of view. Binding energy maps for each oxidation state are obtained with a spatial resolution of 120 nm. Within the framework of a five-layer model, the experimental data are used to obtain quantitative maps of the sub-oxide layer thickness and also their spatial distribution over the p-n junctions. Variations in the sub-oxide thicknesses are found to be linked to the level and type of doping. The procedure, which takes into account instrumental artefacts, enables the quantitative analysis of the full {3D} dataset.},
number = {19-20},
journal = {Surface Science},
author = {de la Peña, F. and Barrett, N. and Zagonel, {L.F.} and Walls, M. and Renault, O.},
month = sep,
year = {2010},
keywords = {Photoelectron emission, Photoelectron emission microscopy {(XPEEM)}, Semiconductor-insulator interfaces, Semiconductor-semiconductor thin film structures, Silicon oxides, Synchrotron radiation photoelectron spectroscopy},
pages = {1628--1636}
},
@article{arenal_extending_2008,
title = {Extending the analysis of {EELS} spectrum-imaging data, from elemental to bond mapping in complex nanostructures},
volume = {109},
issn = {0304-3991},
url = {http://www.sciencedirect.com/science/article/B6TW1-4T2S8W3-1/2/acb6eef10200d49c99310f24108313b7},
doi = {10.1016/j.ultramic.2008.07.005},
abstract = {Multiple least squares fitting has been employed for long time in elemental electron energy-loss spectroscopy {(EELS)} analysis, in particular in biology, but with the hypothesis of a rather stable shape for the used core-loss signals. In the present case, we explore its use for identifying the variations in the edges' fine structures in complex boron nitride samples and in particular for mapping the bonding types of boron in such samples. Details about this improved procedure applied to data acquired in the spectrum-imaging mode are reported here.},
number = {1},
journal = {Ultramicroscopy},
author = {Arenal, R. and de la Peña, F. and Stephan, O. and Walls, M. and Tence, M. and Loiseau, A. and Colliex, C.},
month = dec,
year = {2008},
keywords = {{BNNTs}, Bonding Maps, {EELS}, {ELNES}, Mapping},
pages = {32--38}
},
@article{sanchez_blocking_2010,
title = {Blocking of indium incorporation by antimony in {III–V-Sb} nanostructures},
volume = {21},
issn = {0957-4484},
url = {http://iopscience.iop.org/0957-4484/21/14/145606/},
doi = {10.1088/0957-4484/21/14/145606},
number = {14},
journal = {Nanotechnology},
author = {Sanchez, A M and Beltran, A M and Beanland, R and Ben, T and Gass, M H and de la Peña, F and Walls, M and Taboada, A G and Ripalda, J M and Molina, S I},
month = apr,
year = {2010},
keywords = {{EELS}, {HAADF}, {ICA}, Quantification, quantum dots},
pages = {145606}
},
@article{de_la_pena_mapping_2011,
title = {Mapping titanium and tin oxide phases using {EELS:} An application of independent component analysis},
volume = {111},
issn = {0304-3991},
shorttitle = {Mapping titanium and tin oxide phases using {EELS}},
url = {http://www.sciencedirect.com/science/article/pii/S030439911000255X},
doi = {16/j.ultramic.2010.10.001},
abstract = {We study materials that present challenges for conventional elemental mapping techniques and can in some cases be treated successfully using independent component analysis {(ICA).} In this case the material in question is obtained from a {TiO2-SiO2} solid solution that is spinodally decomposed into {TiO2} {rich-SnO2} rich multilayers. Conventional elemental mapping is difficult because the edges most easily mapped for these elements {(Ti-L}, {Sn-M} and {O-K)} all have onsets within the same 80 {eV} range. {ICA} is used to separate entire spectral signals corresponding to particular material phases or molecular units rather than particular elements and is thus able to distinguish between {TiO2} and {SnO2.} We show that quantification of oxide species can be performed by different methods that require extra assumptions, but nevertheless should be feasible in many cases.},
number = {2},
journal = {Ultramicroscopy},
author = {de la Peña, F. and Berger, {M.-H.} and Hochepied, {J.-F.} and Dynys, F. and Stephan, O. and Walls, M.},
month = jan,
year = {2011},
keywords = {{BSS}, {EELS}, {ICA}, {MVA}, Quantification, {SnO2}, {TiO2}},
pages = {169--176}
},
@article{cooper_field_2011,
title = {Field Mapping with {Nanometer-Scale} Resolution for the Next Generation of Electronic Devices},
issn = {1530-6984, 1530-6992},
url = {http://pubs.acs.org/doi/abs/10.1021/nl201813w},
doi = {10.1021/nl201813w},
journal = {Nano Letters},
author = {Cooper, David and de la Peña, Francisco and Béché, Armand and Rouvière, {Jean-Luc} and Servanton, Germain and Pantel, Roland and Morin, Pierre},
month = oct,
year = {2011},
pages = {111013111159007}
}
@article{Wenner201492,
title = "Atomic-resolution electron energy loss studies of precipitates in an Al–Mg–Si–Cu–Ag alloy ",
journal = "Scripta Materialia ",
volume = "74",
number = "0",
pages = "92 - 95",
year = "2014",
note = "",
issn = "1359-6462",
doi = "https://doi.org/10.1016/j.scriptamat.2013.11.007",
url = "http://www.sciencedirect.com/science/article/pii/S1359646213005642",
author = "Sigurd Wenner and Calin D. Marioara and Quentin M. Ramasse and Despoina-Maria Kepaptsoglou and Fredrik S. Hage and Randi Holmestad",
keywords = "Aluminum alloys",
keywords = "Precipitation",
keywords = "Scanning transmission electron microscopy",
keywords = "Electron energy loss spectroscopy "
}
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