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* written by unit test
* cell C2
* pin p1
* pin p2
* pin p3
.SUBCKT C2 nc_10 n2 n4
* cell instance SC1 r0 *1 0,0
XSC1 nc_10 n3 nc_11 n3 C1
* cell instance SC2 r0 *1 0,0
XSC2 n3 nc_12 n4 n3 C1
.ENDS C2
* cell C1
* pin p1
* pin p2
* pin p3
* pin p4
.SUBCKT C1 n1 n2 n4 n5
* device instance $1 r0 *1 0,0 M4CLS
M$1 n3 n4 n1 n5 M4CLS L=0.25U W=0.18U AS=1.2P AD=0.75P PS=2.2U PD=1.75U
* device instance $2 r0 *1 0,0 M4CLS
M$2 n2 n4 n3 n5 M4CLS L=1.4U W=0.25U AS=1.3P AD=0.85P PS=2.3U PD=1.85U
.ENDS C1
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