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/*
* Copyright © 2015 Guillem Jover <guillem@hadrons.org>
*
* Redistribution and use in source and binary forms, with or without
* modification, are permitted provided that the following conditions
* are met:
* 1. Redistributions of source code must retain the above copyright
* notice, this list of conditions and the following disclaimer.
* 2. Redistributions in binary form must reproduce the above copyright
* notice, this list of conditions and the following disclaimer in the
* documentation and/or other materials provided with the distribution.
* 3. The name of the author may not be used to endorse or promote products
* derived from this software without specific prior written permission.
*
* THIS SOFTWARE IS PROVIDED ``AS IS'' AND ANY EXPRESS OR IMPLIED WARRANTIES,
* INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY
* AND FITNESS FOR A PARTICULAR PURPOSE ARE DISCLAIMED. IN NO EVENT SHALL
* THE AUTHOR BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL,
* EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO,
* PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS;
* OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY,
* WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR
* OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
* ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
*/
#include <assert.h>
#include <stdlib.h>
#include <testu01/gdef.h>
#include <testu01/unif01.h>
#include <testu01/swrite.h>
#include <testu01/bbattery.h>
#define TEST_OK 0
#define TEST_SKIP 77
#define TEST_DIE 99
#define test_print(msg, ...) \
printf("TEST: " msg "\n", __VA_ARGS__)
#define test_res(idx, name, pval, action) \
test_print("[%4d] (%s) pVal[%d] = %f -> %s", \
idx, name[idx], i, pval[idx], action)
static int test_failed = 0;
static void
test_battery_result(void)
{
char **testNames = bbattery_TestNames;
double *pVal = bbattery_pVal;
double pSuspect = 0.001;
test_print("bbattery_NTests = %d", bbattery_NTests);
for (int i = 0; i < bbattery_NTests; i++) {
/* That test was not done: pVal = -1. */
if (pVal[i] < 0.0) {
test_res(i, testNames, pVal, "SKIP");
continue;
}
/* That test passed or failed. */
if ((pVal[i] >= pSuspect) &&
(pVal[i] <= 1.0 - pSuspect)) {
test_res(i, testNames, pVal, "PASS");
} else {
test_res(i, testNames, pVal, "FAIL");
test_failed++;
}
}
}
int
main(int argc, char **argv)
{
unif01_Gen *gen;
int rc;
gen = unif01_CreateExternGenBits("arc4random", arc4random);
/* XXX: The following battery does not set pVal, so we cannot check
* the results. */
bbattery_FIPS_140_2(gen);
/* XXX: The following battery fails one test. */
bbattery_pseudoDIEHARD(gen);
test_battery_result();
bbattery_Rabbit(gen, 33554432);
test_battery_result();
bbattery_SmallCrush(gen);
test_battery_result();
unif01_DeleteExternGenBits(gen);
if (test_failed) {
test_print("failed tests = %d", test_failed);
/* XXX: We should probably FAIL the test, but we currently
* have one test always failing. */
rc = TEST_SKIP;
} else {
rc = TEST_OK;
}
return rc;
}
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