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sample:
model:
origin: guess by J. Stahn
stack: substrate | film | water
sub_stacks:
substrate:
sequence:
- material: Si
roughness: 2
- material: SiO2
thickness: 5
roughness: 3
film:
repetitions: 5
stack: head_group 4 | tail | tail | head_group 4
layers:
tail:
material: tailstuff
thickness: 22.
materials:
head_group:
sld: 0.2E-06
tailstuff:
formula: CH2
mass_density: 1.2
SiO2:
formula: SiO2
mass_density: 2.5
Si:
formula: Si
mass_density: 2.33
composits:
water:
composition:
H2O: 0.3
D2O: 0.7
globals:
roughness: {magnitude: 5, unit: angstrom}
length_unit: angstrom
mass_density_unit: g/cm^3
sld_unit: 1/angstrom^2
reference: ORSO model language | 1.0 | https://www.reflectometry.org/projects/simple_model
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