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#include "autotest.h"
#include "custom.h"
typedef SWORD (*TESTCASEFUNC)(lpSERVERINFO);
extern SWORD testboundparameters( lpSERVERINFO server_info );
struct {
char * name; /* Test case name */
char * desc; /* Test case description */
TESTCASEFUNC lpTestFunc; /* Pointer to function to implement test */
} TestCases[] = {
/* szName szDesc lpTestFunc */
/* -------------------- ----------------------- ------------------------*/
"Test Bound Parameters", "Test Bound Parameters", testboundparameters
};
BOOL EXTFUN AutoTestName(LPSTR szName, UINT FAR * pcbTestCases)
{
strcpy( szName, "Test Bound Parameters" );
*pcbTestCases = NumItems(TestCases);
return TRUE;
}
BOOL EXTFUN AutoTestDesc(UWORD iTest, LPSTR szName, LPSTR szDesc)
{
/* Extra protection should AutoTestName return invalid pcbTestCases */
if(iTest > NumItems(TestCases))
return FALSE;
strcpy( szName, TestCases[ iTest - 1 ].name );
strcpy( szDesc, TestCases[ iTest - 1 ].desc );
return TRUE;
}
void EXTFUN AutoTestFunc(lpSERVERINFO lpSrvr)
{
int iDex;
SWORD cErrCnt; /* Count errors */
char szName[AUTO_MAX_TESTCASE_NAME+6]; /* Room for NULL and \r\n */
/* Sets the error count to 0 */
InitTest(lpSrvr);
/* Loop through the count of test cases looking for set bits via GETBIT. */
/* When a bit is set, that test is to be run. We've stored the */
/* function address which will implement the test, so simply call it. */
for(iDex=1; iDex<=NumItems(TestCases); iDex++)
if(GETBIT(lpSrvr->rglMask, iDex)) {
/* Print out title of test */
strcpy( szName, TestCases[ iDex - 1 ].name );
szLogPrintf(lpSrvr, FALSE, "%s:\r\n", (LPSTR)szName);
/* Call the test case and add errors */
cErrCnt =
(*TestCases[(iDex-1)].lpTestFunc)(lpSrvr);
if(cErrCnt != TEST_ABORTED)
lpSrvr->cErrors += cErrCnt;
else
goto abort;
}
return;
/* When a test must abort, the test case should call the AbortTest */
/* macro which sets lpSrvr->cErrors to TEST_ABORTED. */
abort:
return;
}
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